Measurements of reflectance spectra of highly scattering samples

Unit: Faculty of Physics
Keywords: High light scattering, reflectance spectra, organic compounds, organic electronics, OLED, solar cells, sensors

Measurement of reflectance spectra of highly light scattering surfaces in the wavelength range from 200 nm to 2500 nm.

Minimum diameter of sample – 20 mm;
Wavelength range – 200 nm – 2500 nm;
One sample per one measurement.

Application. Measurement of reflectance spectra of highly light scattering organic compounds is an important part of systematical characterization which lets to evaluate its perspectives to be used in modern organic electronics devices (organic light emitting diodes, organic solar cells, sensors). 

Contacts: Dr. Karolis Kazlauskas, tel. +370 600 34126,