- Unit: Faculty of Physics
- Keywords: Ecopia, HMS-3000, Hall effect, characterization of samples, resistivity, mobility, carrier concentration, conductivity, magnetoresistance, Hall coefficient
- Responsible person: Dr. Vitalijus Bikbajevas, tel. +37060034126,
Complete system for measuring resistivity, mobility, and carrier concentration by Hall method.
Possibility to perform measurements at low (liquid nitrogen temperature). Possibility to perform I-V curve measurements.
Current source range: 1 nA – 20 mA.
Sample size: max 2 cm × 2cm;
Measurement materials: All semiconductors including Si SiGe, SiC, GaAs, InGaN, InP, GaN (n type and p type);
Resistivity measurement range: 10-4 – 107 Ω∙cm;
Mobility measurement range: 1 – 107 cm2/V∙s;
Bulk carrier concentration measurement range: 107 – 1021 cm-3;
Other measurement types: conductivity, magnetoresistance, Hall coefficient, V/H ratio of resistance.
Application. Characterization of samples by Hall method. GaN, Si and other semiconductors measurements.