Pulse X-band EPR spectrometer Bruker Elexsys E580

Pulse X-band EPR spectrometer Bruker Elexsys E580

Sukurta: 20 November 2018
Unit: Faculty of Physics
Keywords: Electron spin, EPR, spectral analysis, defects, impurities, free radicals, crystal compounds, organic compounds, Bruker, Elexsys E580
Responsible person: Dr. Eugenijus Gaubas, tel. +37060034126,

EPR spectrometer Bruker Elexsys E580 operates in a X-band (~10 GHz) range, in continuous and pulsed probing modes.

The main components of the spectrometer are: microwave resonator, where the sample is placed, microwave bridge, electromagnet, power supply for magnet, electronic block with an installed oscilloscope, and a computer for data registration and analysis. Resonators could be placed in special cryostats and the measurements could be done in low temperature, using liquid nitrogen or liquid helium. Measurements could be done as well in high temperatures, using the heating elements. The temperature is controlled and stabilized using a computer. Only one sample can be investigated during a single measurement. Maximum magnetic field 1,5 T, temperature measurements in range from 4 K to 300 K, microwave power - 150 mW. 

Application. Spectral analysis of unpaired electron spin (EPR), for identification of defects, impurities and free radicals in crystal and organic compounds. Spectral analysis of electron spin (EPR), for identification of defects, impurities and free radicals in crystal and organic compounds in a temperature from 4 K to 300 K.

 

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