Scanning near-field optical microscopy eqipment (Alpha300R, WiTec)

Scanning near-field optical microscopy eqipment (Alpha300R, WiTec)

Sukurta: 23 November 2018
Unit: Faculty of Chemistry and Geosciences
Keywords: Scanning near-field optical microscope, SNOM, Alpha300R, WiTec, surface structure, chemical composition, surface morphology
Responsible person: Lina Mikoliūnaitė, +370 5 2193186, Arūnas Ramanavičius, +370 5 2193185,

Scanning near-field optical microscope (SNOM) is integrated with an optical microscope (resulting in a reflection image), a Raman microscope (532 nm excitation source), and an atomic force microscope.

Application. SNOM can be used to study nanoscale surface structures excitated by 532 nm laser. Raman spectroscopy is designed to determine the chemical composition of a sample using vibrational spectra of compounds. Atomic force microscopy can be used to depict morphology of a surface with unevennes of a few nm to 1 micron.