- Unit: Faculty of Physics
- Keywords: Scanning electron microscope, SEM, morphology, Hitachi, TM-1000
- Responsible person: Dr. Mangirdas Malinauskas,
Accelerating Voltage 15 kV, maximum magnification 10000, maximum sample size 70 mm in diameter, maximum sample height 20 mm, detector – backscattered electron detector (BSE).
Application. Microscope is suitable for investigation of samples morphology.