The combined examination of current and capacitance characteristics for control of junction structures and measurements of the main operational parameters

The combined examination of current and capacitance characteristics for control of junction structures and measurements of the main operational parameters

Sukurta: 27 November 2018
Unit: Faculty of Physics
Keywords: Current-voltage characteristics, capacitance-voltage characteristics, temperature scanner, junction structure, impact of radiation

Computer controlled temperature scanner of the current-voltage and capacitance-voltage characteristics, produced at Vilnius University, measures in the range of 0 – 600 V bias voltage and of 100-300 K temperatures. The C-V characteristics are measured in the range of 10-2´106 Hz using small test signals (20-100 mV).

This measurement system is designed for analysis of the impact of the radiation, thermal and combined treatments. These measurements can also be applied for the quality control of the junction structures and opto-electronic devices. 

Application. Enterprises of electronics and photo-electricity. Enterprises producing lasers. Control of the changes of the operational characteristics of devices under radiation, thermal and combined treatments. Ex-situ control of the impact of irradiations. Control of frequency dependent parameters in optoelectronics.

Contacts: Dr. Eugenijus Gaubas, tel. +37060034126,