- Unit: Faculty of Physics
- Keywords: Barrier evaluation, photo-electrical semiconductor devices, irradiation, RIGOL, Agilent Technologies
These measurements are addressed to control of spatial, spectral and temperature changes of the barrier parameters in junction structures due to doping and formation of technological as well as heat treatment defects.
Application. Enterprises of electronics and photo-electricity. Control of variations of the operational characteristics of devices under radiation, thermal and combined treatments. Ex-situ control of the impact of irradiations.